Muckstadt inspects a silicon chip wafer at IBM

During a Master of Engineering project visit to an IBM facility in Poughkeepsie, New York in 1987, Muckstadt inspects a silicon chip wafer.  Behind Muckstadt are team members Christopher Glynn '86 M.Eng. '87 MBA '88 and Firoozeh Mostashari AB'86 M.Eng. '87.  IBM employee and Cornell alumnus Michael Isaac Ph.D. '79 is at right.  Isaac was the client for the project, which analyzed module production and raw materials inventory policy at the facility.